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Product Information

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Semiconductor Laboratory

Hydrofluoric Acid – Automated Analysis of Semiconductor Grade HF with prepFAST S and NexION 5000 ICPMS

ID: 69
Category: application-notes
ESI System: prepFAST S
Application: Semiconductor Laboratory
The prepFAST S ultraclean sample preparation and introduction system minimizes contamination from the environment and sample handling, enabling semiconductor manufacturers and laboratories to easily analyze these critical samples. The prepFAST S features inline, automated calibration and dilution technology that automates sample and standard preparation.

HNO3 – Automated Analysis of Semiconductor Grade HNO3 with prepFAST S and NexION 5000 ICPMS

ID: 70
Category: application-notes
ESI System: prepFAST S
Application: Semiconductor Laboratory
Nitric Acid is widely utilized in the semiconductor industry as a cleaning agent. The reduction of potential contamination of silicon wafers during the cleaning process is crucial as trace metal, particulate and organic contaminants can alter the functionality of the semiconductors. At the ppt level, environmental contaminants are difficult to control and can easily contaminate a HNO3 sample if not properly handled.

H2SO4 – Automated Analysis of Semiconductor Grade H2SO4 with prepFAST S and NexION 5000 ICPMS

ID: 71
Category: application-notes
ESI System: prepFAST S
Application: Semiconductor Laboratory
Sulfuric acid (H2SO4) is used in the semiconductor industry as a means to clean and etch silicon wafers. The reduction of potential contamination of silicon wafers during the etching process is crucial, as trace metal, particulate, and organic contaminants can alter the functionality of semiconductors. At the sub-ppt level, environmental contaminants are difficult to control and can easily contaminate a H2SO4 sample if not properly handled.

BOE – Automated Analysis of Semiconductor Grade BOE with prepFAST S and NexION 5000 ICPMS

ID: 72
Category: application-notes
ESI System: prepFAST S
Application: Semiconductor Laboratory
Buffered oxide etchants (BOEs) are blends of hydrofluoric acid, ammonium fluoride, surfactants, and ultrapure water utilized in the semiconductor industry to etch thin films of silicon wafers. The reduction of potential contamination of silicon wafers during the etching process is crucial, as trace metal, particulate, and organic contaminants can alter the functionality of semiconductors. At the sub-ppt level, environmental contaminants are difficult to control and can easily contaminate a BOE sample if not properly handled.

TMAH – Automated Analysis of Semiconductor Grade TMAH with prepFAST S and NexION 5000 ICPMS

ID: 73
Category: application-notes
ESI System: prepFAST S
Application: Semiconductor Laboratory
Tetramethylammonium Hydroxide (TMAH) is a basic solvent widely utilized in the semiconductor industry for photoresist development and lithography applications. The reduction of potential contamination of silicon wafers during the etching process is crucial as trace metal, particulate and organic contaminants can alter the functionality of the semiconductors. At the ppt level, environmental contaminants are difficult to control and can easily contaminate a TMAH sample if not properly handled.

Ultrapure Water – Automated Analysis of Semiconductor Grade UPW with prepFAST S and NexION 5000 ICPMS

ID: 74
Category: application-notes
ESI System: prepFAST S
Application: Semiconductor Laboratory
Ultrapure water (UPW) is widely utilized in the semiconductor as a cleaning agent. The reduction of potential contamination of silicon wafers during the cleaning process is crucial as trace metal, particulate and organic contaminants can alter the functionality of the semiconductors. At the ppt level, environmental contaminants are difficult to control and can easily contaminate an UPW sample if not properly handled.